Hello every one , i use x-ray microanalysis for sample include multi elemental composition i will identify the element with a concentration less than 5 wt% is difficult cause of week and noisy and overlapped peaks. any suggestion
Dear Sami Alshammary ,
you should share some details about your sample system...
so for example, which elements (atomic number Z ?) you are looking for in your sample?
For very low Z elements you are in trouble...
Some suggestions:
a) for increasing visibility (reducing noise) you should go for quite large acquisition times, and
b) for reducing peak overlap (medium to high Z elements), you may go to K-shell excitation; so in addition have a look at the K-fluorescence (increase of excitation energy, Voltage). K-lines are more spread in a larger energy range compared to the L-lines...
Good luck and
best regards
G.M.
Show your spectra, otherwise it's difficult to give advise besides the very basic one: increase your beam intensity and/or acquisition time.
Without the spectra, I can only provide general answers.
1. Please consider the energy line you are looking at. If it’s below 5 keV, consider to look at other lines. There are a lot of elements that overlap in this region.
2. if looking at other lines, please make sure there isn’t any overlapping lines with the target elements.
3. the activation energy for each line is about 2-3x higher than the line, so please consider the acceleration voltage used in the scanning electron microscope.
4. lastly, the resolution of EDS is about 0.123keV when dead time 3 or 4 is used. If you need higher resolution than this, consider using WDS. The resolution of WDS is about 15eV.
hope this helps!
Cheers!
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