hello,
it depends on your sample. If it is an inifnite medium such as substrate without back reflection, you can invert directly psi delta measurements to obtain the refractive index. Then the Brewster angle is given by atan(n/(refractive index of ambiant medium))
thank you so much for your help............. does the ellipsometry measurements has to be taken exactly at Brewster angle or it has to be taken slightly above or below it?
hello,
it is not necessary to work exactly at the Brewster angle. If you work exactly at brewster angle, on a semi infinite medium, one polarization is cancelled, and so psi=90° and delta cannot be measured.
if you work just above it, collected ligth is higher.and you have a good sensitivity on the delta angle.
If you are working on a thin film on substrate, you can work with the mean brewster angle of the substrate.
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