We will be very grateful for a discussion, experience sharing, possible experimental challenges for the accurate and reliable photoluminescence (PL) investigation of 2D TMDC layers/films (WSe2) using Spectrofluorometer with a monochromatic light source (Xe arc lamp).

We have performed PL spectral analysis of various WSe2 films (mono- and multilayered) on different substrates (c-cut sapphire, fused silica, SiO2, Si).

PL properties of WSe2 (and other semiconducting TMDC) are extensively investigated with a strong thickness dependence and usually broad peaks structure. The majority of the PL studies are based on a laser source configuration, while the PL analysis of TMDC thin films using Spectrofluorometer are very rare.

However, our acquired spectrum (for all studied thin film samples) is untypical and consists of single very narrow peak at 754nm(1.64eV) with linewidth ~ 10meV at λexc = 500nm.

The samples are produced by Chemical Vapour Deposition and Thermal Assisted Conversion.

Thank you!