Hello everybody, I measured scattering of light from a nanoparticle (which is 70% non-spherical , and a composite of many closely packed ,unshaped particles inside it according to SEM results) by using an imaging system which is called Polarization PIMI (Parametric Indirect Microscopic Imaging) . This system PIMI indirectly obtains the contrast built by the indirect optical wave parameters obtained from modulated optical field. The schematic of the system is attached with this question as an image. I have used light source filter of 532 nm ,microscope is Olympus BX51. When I got results I shocked to see that PIMI detected some ripples in near to far field boundary(say 2 microns from the center of particle) but when I applied same conditions on direct field measurement ( I mean without solving indirectly) I found no ripples. I did not understand why these ripples appears, what can be the origin of that??? The material of nanoparticle is Diamond like carbon(DLC).