We are using ellipsometery to find thickness of MEH-PPV thin films and MEH-PPV/GQD? What could be most appropriate model to fit the ellipsometery data to get correct thickness as well as n and k parameters?
The n, k values taken from ellipsometry depends on the film design and the composition of each films (ex. fraction of void, molecular ratio). Therefore, I do not recommend you to 'measure' thickness of your MEH-PPV/GQD film because the MEH-PPV/GQD may not give you reliable reference n, k values.
I recommend to use AFM for thin films, or use cross-sectional SEM (if the film is very thick).
Zahida Batool If you know the thickness then you can get the n and k values. If you know, or assume, the n and k values you can get the thickness. You can’t get all parameters simultaneously. It’s easy to get an independent thickness measured, say with a step profile gage, and thus get n and k. Note there is not one model that can fit 'the ellipsometry data of polymer and organic semiconductors’…
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