In general, maybe the Low Jsc problem in inverted perovskite solar cell device, due to a charging transport, while the Low FF problem due to an active perovskite layer, and spiro hole transport layer respectively. But in this case, I agree with Prof.Abdelhalim Zekry because of His high experience in his field research.
It seems that you have some nonlinear ohmic contact in your structure. It is required to test your HTL contact with the the TCO anode. The same holds for the ETL with your Ag cathode. This can be done by measuring the IV curves of such contacts. You have also to check that the ETL contains high electron concentration and the HTL must be verified to for high hole concentration.
It is good that you report about your investigations to benefit of your colleagues on the RG.
In general, maybe the Low Jsc problem in inverted perovskite solar cell device, due to a charging transport, while the Low FF problem due to an active perovskite layer, and spiro hole transport layer respectively. But in this case, I agree with Prof.Abdelhalim Zekry because of His high experience in his field research.
Although I don't have any fabrication experience at all, but I think (from my little bit simulation based research experience), the following factors could be the probable reasons behind low Jsc and low FF,
# Contact layer characteristics as mentioned by @Abdelhalim Zekry
# Poor perovskite layer film quality (higher trap density) leading to shorter diffusion length of photo generated carrier.
# Poor interface resulting high carrier recombination rate. It affects the FF.
# Carrier density in the HTM / ETM layer as it has effect on the series resistance of the cell which lowers the FF
# Front contact reflection, it may reduce the Jsc without affecting Voc much
1. Voc is low, mainly due to defects in the internal and external interfaces of perovskite. It is therefore recommended to optimize the perovskite layers and interfaces.
2. Jsc and FF are too low and should theoretically be above 20 and 70. It is estimated that there is a problem with your HTM layer, that is, the NiOx film. Of course, the problem may also be caused by PCBM and electrodes, please check carefully.
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Lei Shi Nice insight, indeed! For the theoretical study, one of my following works may come in handy although the absorber material is a bit different.
Conference Paper Simulation based Investigation of Inverted Planar Perovskite...