I need to obtain orientational and phase maps from polycrystalline substrates and then films on them(for Combinatorial Substrate Epitaxy (CSE) method). Canonically, it is done by Electron Backscatter Diffraction(EBDS) technique. However, I do not have access to this method. Is there an alternative to Electron Backscatter Diffraction(EBDS)?
do ist classic: XRD (texture, phase analysis) and metallography (OM, SEM) possibly with sloping grinded. For more details use TEM, compare:
Schwarzer, R.A.: Advances in the analysis of texture and microstructure, Archives of Metallurgy and Materials, 2005, 50(1):7-20, 200, ISSN: 0860-7052
https://www.researchgate.net/profile/Robert_Schwarzer/contributions
Dear Dr. Volker Klemm,
Would you be so kind to rewrite your message since it is not clear what exactly you meant by it.
TEM will not work since the thickness of the specimens more than 100 nm.
XRD could work, but it requires a large 2D area X-ray detector.
Article X-ray Diffraction Area Mapping of Preferred Orientation and ...
For XRD texture measurement you need not a 2D detector, you can use an old texture diffractometer. For TEM investigations you must before thin in cross section or in plan view orientation; of course this is more complicated than with EBSD, compare:
http://www.doitpoms.ac.uk/tlplib/crystallographic_texture/texture_measaurement.php
Article A modular programme for the preparation of inhomogeneous mat...
Article Interplay between the deposition mode and microstructure in ...
Article X-ray diffraction on nanocrystalline Ti1−xAlxN thin films
Hey Mikhail,
try electron channeling patterns (ECP). Its a gyration of the SEM beam on one sample spot, creating a pattern similar to electron back scattered patterns. see:http://www.metal2014.com/files/proceedings/02/reports/453.pdf
or you go for Kosseldiffraction in the SEM, see: http://www.uni-leipzig.de/~minkrist/pdf/IMKM_kossel.pdf
Confocal Raman microscopy could also work for obtaining phase maps of polycrystalline substrates.
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