Unless there is some systematic error on the instrumentation used, I have observed an inverted peak when measuring the FMR absorption derivative for a YIG/NM/m-FM thin-film sample. The YIG layer was deposited via magnetron sputtering on GGG(111) substrate and is not monocrystalline but exhibits only a few crystalline phases. The observed anomalous peak is normal at lower frequencies, goes through a change at 2.5 GHz and becomes inverted at the higher range. Another peak observed for the same sample (probably corresponding to a different crystalline phase) is not inverted but at least four times more intense, both at lower and at higher frequencies. Both peaks occur on the same FMR dispersion curve.