A ZrB2-SiC composite doped with silicon nitride has been evaluated by HRXRD.
Some obtained patterns are just showing ZrC phase without any trace peaks of ZrB2 or SiC. Although the formation of ZrC is reasonably possible (mainly in interfaces of ZrB2/ZrB2 and ZrB2/SiC particles), but I just want to know that why some patterns are just consisted of ZrC? Is it due to the point to point diffraction patterns from HRXRD?
Dear Behzad,
I recommend to use Microfocus XRD to get point to point XRD pattern for the samples. By using cross section of your samples, it will be easy to draw a profile of graphs point to point from sample’s surface to substrate by this apparatus.
Post your XRD data with all the juicy details when convenient.
Some background literature will help
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- What is the end use application for these types of composites?
Polycrystalline or monocrystalline substrate/film?
https://www.researchgate.net/post/What_is_the_best_way_to_interpret_REAL_TIME_3D_X_Y_o-2TH_o_ph_ch_reciprocal_space_relative_intensity_data_from_HRXRD_rocking_curve_analyses?_tpcectx=profile_questions
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