Dear All,
There are some extra XRD peaks appearing when SnO2 nanofiber was treated with TiCl4 aqueous solution. Could some one explain that what are the sources of these new peaks?
Please check the JCPDS data of Ti and Cl. These peaks would belong to these materials.
The appeared diffraction peaks other than the SnO2 peaks were possible resulted from TiCl4 treatment. To identify the formed phases, it is better first check the TiCl4 treatment conditions under which what kind of crystalline phases may form. Please check TiO2 and also Ti. Did you apply post-treatment calcination?
Dear @Mirabbos,
Yes, we apply post-treatment calcification. Initially the SnO2 nanofibers past was coated on the FTO then dipped into the TiCl4 aqueous solution followed by calcination at ~450 oC. It is obvious that the new peaks come from the TiCl4 but could you please highlight how these peaks forms. I mean what chemical changes occur or some new bonds form between SnO2 and Ti particles?
In your case following compound is likely to be contributing. I can firmly say only if I can have your x.y data.... So that I can overlap and confirm....
TiO2
P 42/m n m
4.58878; 4.58878; 2.95756
90; 90; 90
62.277
See the attached file containing figure....
Bottom is XRD pattern originating from above mentioned TiO2 phase...
I think the attached paper give some idea about your Problem. First peak is your Anatase (101) followed by SnO2 (110) and there is a peak
http://www.sciencedirect.com/science/article/pii/S002236971400184X?np=y
Many thanks dear @ Bhange D.S. and @ B.Mallick for your helpful answers. I will look on those responses, hopefully these will give me some direction.
I will email you soft copy of simulated xrd data of different tio2 phases by tommorow so that you can make overlap plot and check by yourself...
I will email you soft copy of simulated xrd data of different tio2 phases by tommorow so that you can make overlap plot and check by yourself...
Rutile is more likely matching to your pattern... But confirm by plotting the following three different XRD (theoretical) patterns with that of yours......
Open the following file in origin software and use only first two columns for comparison...
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