The following could be helpful to you:
https://www.researchgate.net/post/Does-anyone-have-experience-with-quantity-of-impurities-in-XRD-pattern
Hello Jamil,
XRD is a tool to investigate the structure of solids. If the doping is high enough to influence the structure, then you have an indirect detection of the presence of dopands.
To carry out a chemical analysis, X-ray absorbtion could be a good tool. Nevertheless, the sensitivity for low concentrations is low. If you want to investigate doping concentrations below 1017 cm-3, I recommend SIMS (secondary ion mass spectrometry). There you can detect concentrations up to 1014 cm-3
With Regard
R. Mitdank
Hello Jamil Ahmed Buledi , You typically first run a Search/Match that compares your XRD Scan to the Peaks of Reference Patterns in one or more Reference Databases (PDF2, PDF4+, COD etc.).
Then you try to explain all peaks in your scan by the high scoring Reference Patterns that were found during the search/match process.
Or, when you know what Phases to expect, you simply load the expected Reference Patterns from the Reference Database into the Pattern List of your Search/Match software.
When the loaded/expected Reference Patterns explain all peaks of your XRD scan you have no impurities. If you have unexplained peaks left, you will go on with search/match and try to match these unexplained peaks by peaks of Reference Patterns from Reference Databases. In the end, when all peaks are explained, you have a Qualitative model of your sample.
You then can take that Phase model and execute a Rietveld refinement to produce a Quantitative phase analysis, that will tell you the mass% of your phases/impurities.
Please refer below links of the given entitled article to get some relevant feedback. Kindly note that the article is not peer reviewed yet.
Qualitative Analyses of Thin Film-Based Materials Validating New Structures of Atoms. (2021), https://www.researchgate.net/publication/352830671or http://dx.doi.org/10.13140/RG.2.2.27720.65287
In X-ray analysis, changing GIA can help to understand the material’s properties in a broader perspective. From the characteristics of peaks resulted in pattern, we can get some idea about the texture of deposited/processed/synthesized material, but within the surface area dealt with the exposure of X-rays. However, by changing the position of sample and under repeated X-ray analysis, it is possible to draw the picture of texture in broader context. To study texture coefficient for a particular material, the development of a master pattern is necessary, which can be the reference pattern.
You may take the X-ray pattern of your sample by changing the GIA, i.e., 0.1 deg., 0.3 deg., 0.5 deg., 0.7 deg., 0.9 deg. you will see in the resulted pattern different scans of your same sample. In this way, you can explain the different factors related to structure of your material. At low GIA (0.1 deg.), you may get less peaks and less complicated/complex pattern, but at high GIA (0.9 deg.), you may get more peaks and more complicated/complex pattern. Please read the article to get better know how (https://www.researchgate.net/publication/352830671or http://dx.doi.org/10.13140/RG.2.2.27720.65287). Good luck
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