I have the reflectance profiles of soils samples from 360-2500 nm in 1 nm intervals. I want to model the soil chemical attributes using these reflectance data but 1 nm intervals is cumbersome to work with. So far, I've been using the reflectance every 10 nm as predictors in my models. My question is whether there is some way to maximize the strength of the relationship between the reflectance and soil chemical attributes without regressing each 1 nm reflectance value against each soil attributes? My thinking is that since reflectance values are positively correlated with proximity in wavelength, there must be some resampling methodologies.

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