BaTiO3 is a semiconductor so should not really need a Au or other conductive film deposition for a good image. If you can send an image you already have or the Vacc, WD, the mode, diaphragme size and the detector you use may be we can help more.
I also did not understand if it is because of your preparation or because of the mode you are trying to use. There is a new approach which I find very interesting, you may look for other articles too. You may contribute to this field with your work if you are interested. Do not let the title mislead you just have a look at it. i.e. Fig 2.
Observation of Ionic Liquid by Scanning Electron Microscope
Abstract: It has been discovered that ionic liquid can be observed by a scanning electron microscope without accumulation of electron charges, allowing SEM observation of insulating specimens wetted with ionic liquid.
If it does not work for you, you may want to have a clean substrate n-Si and prepare a diluted solution of your nano particles in a relevant solution which would evaporate fast and deposit on the substrate. Well, here is a nice tutorial http://mtse.unt.edu/FACULTY/bgorman/sample%20prep.pdf
If you are trying to see the nanoparticles directly the charge effect could be strong. Preparing a pill you can reduce this effects, set a rapid scan with a long image integration and a good ground connection should work fine.
I have the experience 40 years ago try to see BaTiO3 naan particles prepare by pyrolysis method. The paper was published in Ferroelectric Jounal (1973?) I used TEM instead of SEM for examination. The dispersion method was not clear that time myself and the pacticles stick together and hard to know the particle size.The particle size was finally deterninated by X-ray broadening technique.
Now I think you can try non-polar organic solvent to overcome the Van der Waals sticking.
You have to understand that SEM has its limits and it will not work with certain sized nanoparticles (depends on manufacture of SEM and year for production).
Do you know approximate size? You can use DLS to get an idea what you are dealing with. And if SEM still fails you, TEM or/and AFM has/have to be used.
I agree with Dmytro. The resolution of the SEM may not be good enough for the size of the nanoparticle you are measuring. Older SEMs can only go to 500 nm or so. Hence, if your nanoparticle is smaller than that then you will not get a good picture. The best instrument, even the older ones, to use for nanoparticles as small as 2 nm will be TEM with low nm resolution of course.
I agree with Dmytro and Zoraida. It depends on the size of nanoparticles.To observe nanoparticles which the size of less than 20 nm high magnification resolution equipment is FESEM (field emession scanning elecron microsrocope) besides SEM/TEM/AFM. If your sample is easily charging you may need to coat thin layer of platinum or gold using sputter coater.
Hi Agustine, recently we have imaged 15 - 20nm TiO2 and BaTiO3 particles synthesized by us in a Hitachi Type II S-3400N Fully Automated Variable Pressure SEM for Raman, PL, EDS and SEM imaging. We had some serious time put in figuring out how and what substrate to use for imaging. However, for this measurement it did not matter whether we could see individual particles. To see individual particles we used solution cast sample - on a TEM grid - in a TEM routine. However, I have imaged larger particles that are commercially available, in the range of 10s of microns under no special conditions. All posters before me have made very similar observation but (no offence!) you do not seem to be reading them. Bottom-line, if you do not give us more details or interact with the posters I doubt anyone can help you.