Dear colleagues,

can anybody suggest how to measure experimentally CONDUCTIVITY ELECTRON MEAN FREEE PATH (λ) in the thin metallic film?

First of all, I'd like to know how it's change with the film thickness and grain size.

The film material is a bismuth.

Resistivity vs temperature, Hall and Magnetoresistance measurements up to 2Tesla are available.

Some methods are based on Drude's model. But it's also known from literature that "the mean free path of electrons in any metal, calculated on the basis of Drude’s model was ten times less than the experimentally observed value" [http://www.newagepublishers.com/samplechapter/002014.pdf]

That is the most reliable experimental method to determine λ?

Best regards

Yevhen