I had some trouble fitting, using GenX, XRR data. The measurement was taken together with the XRD hence the data has an increase in intensity where a peak would be amplifying the kiessig fringes.

The lower angle data is fitted, but higher angle is not.

Can anyone help?

Edit:

Apologies for not being clear.

My sample is Bi2Se3 with an unkown oxide. It is grown in an MBE on a sapphire substrate. Attached is a GenX fit picture and file . and linked here is another paper on the same material pg 45-46 which has fitted correctly the XRD peaks of a lower thickness overall.

https://researchrepository.wvu.edu/cgi/viewcontent.cgi?article=6177&context=etd

(pg45-46)

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