I have tried XRD, Confocal raman and FTIR. As film is very thin I couldn't get much information from XRD. In confocal raman (Renishaw Invia) measurements it is giving glass amorphous back ground, PVDF peaks are not much visible and peak positions are not consistent.
If the film is very thin, you will not get much information from conventional XRD. If possible, try for Grazing Incidence XRD Technique, which is suitable for very thin films.
Suchitra Sen
Thanks for ur kind reply
I have already done XRD 2theta scan for different omega values in thin film attachment mode. As polymers are not fully crystalline (semicrystalline), it was found difficult to get information
XRD is the best. I think u can also try to use DSC and ATR to get the crystalline peak.
If the film is not so thin (sub-micron), you can peel off the glass substrate in NaOH solution. You can use two or three thicknesses of the films on SI wafer.
Depending on material you may want to do suitable heat treatment before you use XRD. RTA may also help, but you will need to peel / scratch the film first
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