I was characterizing the e-beam deposited CuxO films/nanorods; and I found that Cu2O and CuO (or Cu and Cu2O) are co-existed during annealing at different temperatures, i.e. before turning into a single stable phase (of polycrystalline of the mentioned phase(s)). So, I was wondering if there is/are any method(s) to estimate or compare their amount in the mixed phases (for e.g. Cu2O and CuO).

I have attached the XRD patterns of CuxO. Hope this will help to suggest whether we can use their peaks for estimation or not.  Your help will be much appreciated.

Thank you.

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