I run XRD on nanocomposite films. It would be highly appreciated if you let me know about any methods to compute the crystalline/amorphous content of my sample.
You can carry out X-ray diffraction analysis for your samples and you can view the pattern. It shows the variation of crytsalline and amorphous nature.
The best approach is by Rietveld Method. With right software and a math background, its possible to take into account different sources of background noise and distinguish then between the amorphous content contribuition (http://scripts.iucr.org/cgi-bin/paper?ce5094).
Other way is to use a known standard with your sample (http://www.xrd.us/technote/amorphous%20content%20determination.htm).