Is there any corresponding intrinsic characteristic of each grain/grain boundary (interface) in dielectrics with fixed value (e.g. εeff ~100 for CaCu3Ti4O12) or not ( εeff value is fixed or with different grains or materials will change )?
What is Physical origin of it?
Can we calculate the "thickness of grain boundary, tgb" out of εeff ~ tg/tgb using a SEM image?
You can set up equivalent circuit models, but even this does not provide direct values separately for the bulk and the boundary only helps to understand changes
Effective permittivity is normally related to the voidage of the material, grain shape and density. Relative permittivity is the average of bulk material. What is the specific frequency of interest you are trying to use? any specific application?