Actually,

Is there any corresponding intrinsic characteristic of each grain/grain boundary (interface) in dielectrics with fixed value (e.g. εeff ~100 for CaCu3Ti4O12) or not ( εeff value is fixed or with different grains or materials will change )?

  • What is Physical origin of it?
  • Can we calculate the "thickness of grain boundary, tgb" out of εeff ~ tg/tgb using a SEM image?
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