I have XRD data of the KBr thin film deposited on Al disc. The XRD pattern of KBr at 2theta = about 38 degrees, which overlapped with XRD data of Al disc. I want only XRD data of KBr thin film, for strain analysis using W-H method.
with the W-H method you do not do a "strain analysis", sorry. You just try to see if the broadening has some trend with the distance in reciprocal space. This can be the hint for the presence of lattice defects or of anisotropic domain shape.
In your case, besides trying to understand what you really want to measure, you can do two things:
- model the pattern including both the substrate and the film
- if the film is not oriented and sufficiently thick, try to do the measurement at grazing angle so that the signal of the substrate will not be present
Thank you Matteo Leoni for your kind suggestion. But As I know, for Strain analysis using W-H method, we must have at-least 3 xrd peaks of the thin film, and the xrd peaks should be shifted from their ideal peak position. In my film we have 3 xrd peaks of KBr, but one of them is overlapped with Al substrate xrd peak on which KBr is deposited. but I will do another xrd measurement of KBr/Al at grazing angle.
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