I have done both C-f and C-V measurements at room temperature (300 K) for my devices. However I am not sure on how to estimate the trap density of states (tDoS) since I am not sure of the dielectric constant and attempt to escape frequency. I see some papers have plotted the tDoS by this technique (e.g. doi:10.1038/ncomms6784). However there is no mention on how these two parameters were estimated. I want to compare two different devices where the active layers processed under different conditions. Will the dielectric constant and attempt to escape frequency be the same for the two. Is it possible and right to estimate tDoS without performing C-f measurements at different temperatures?
the attempt to escape frequency could be measured by temperature-controlled experiment, this could be found in many original publications as done in silicon, GaAs solar cells or other PN junction related devices. Anyhow, it is a well-established technique.
Thanks Dr. Zhou for your answer and help. Some authors have calculated the tDOS without using temperature dependent capacitance measurements as I have stated this in question. I am not sure if it is right to calculate tDoS without doing temperature dependent C-F. Secondly as the authors of that paper (doi:10.1038/ncomms6784) do not mention, I believe they has assumed attempt to escape frequency value.
If I have two devices with the same material processed in two different ways, will the attempt to escape frequency be the same? Will it not change based on the capture cross section? In such a case, is it not wrong to assume the value?
I am not sure how these papers get accepted in Nature when either the authors intentionally miss giving information or perform wrong calculations based on certain assumptions
It's a good question indeed. I would assume that they did the temperature dependent measurements, but don't show them in the paper for a non-obvious reason. Otherwise it would indeed just be an assumption and the values on the energy axis would not be correct.
Thanks Guy...I am pretty sure they did not perform temperature dependent measurements...So certain values would have to be assumed ...
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