Since its a second pass measurement, I think I do not need to subtract a 2nd or 3rd order plane. Isnt it? Do I have to perform 'fit line' in order to realign better the scanned line in the whole scan areas? Thanks in advance for any kind explanation.
I would think you do not need to do any plane fit for SKM images, although I have seen some papers that have done it. I feel surface potential should be independent of surface topography. However I mainly do single pass so some one who does lift mode can guide you better.
The SKM signal is voltage in different points of sample, it should be independent of height, and not require such corrections. If you have "tilted" appearance of second-pass scan, you either have the low conductivity of sample (so potential is changing towards the grounding point where second contact is applied), or deltaz and initial amplitude settings is wrong chosen and you have interplay between Van-der-Waals and electrical forces in second pass (the second pass measurements is not purely electrical, usually it is due too high initial probe amplitude or too low deltaz).
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