How can we measure work function of material deposited single layer thin film on glass or ITO substrate??
Dear Muhammad Usman ,
You can use Kelvin probe force microscope (KPFM) or Kelvin force microscope (KFM) which is based on an AFM set-up.
The VCPD value can be measured by applying VExt to the AFM tip, such that the output signal of the lock-in amplifier is nullified and Fω reaches to the zero. Subsequently, the value of VExt is obtained for each point on the sample surface and maps the work function or surface potential of the whole sample surface area
Dear S Kalaiselvan ,
Scanning Kelvin probe microscopy (SKPM) has the capability to measure the work function or surface potential. The VCPD value can be measured by applying VDC and VAC between the tip and sample. Out put signal is nullfied and Fω reaches to the zero (Fω=0). Because if Fω reaches minimum, the VCPD can be acquired which shows the local work function or surface potential of sample.
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