Dear Surbhi Sharma ,

You can study the properties and test the heterojucntions by the following methods:

- Measure the I-V curve

If the junction is rectifying it will show rectifier I-V curve.

- Measuring the C-V and g-V characteristics of the junctions.

- You can use the Kelvin probe

To utilize the C-V and g-V measurements to characterize heterojunctions please refer to the paper in the link:Article Capacitance and conductance of ZnxCd1-xS/ZnTe heterojunctions

Best wishes

Dear Surbhi Sharma ,

You can study the properties and test the heterojucntions by the following methods:

- Measure the I-V curve

If the junction is rectifying it will show rectifier I-V curve.

- Measuring the C-V and g-V characteristics of the junctions.

- You can use the Kelvin probe

To utilize the C-V and g-V measurements to characterize heterojunctions please refer to the paper in the link:Article Capacitance and conductance of ZnxCd1-xS/ZnTe heterojunctions

Best wishes

KPFM is certainly a good technique to identify such heterojunction. You can probe the different contact potential for the heterojunction.

However I believe Scanning Tunneling Microscopy is a better technique.

Here you can probe the topography and from DOS Spectra even you can calculate band positions or any kind of band bending. You will find such papers where a pn junction in a single nano rod has been mapped.

If you need such measurements, our group is available for sustainable collaborations.

Thanks @ Abhishek for the useful info.