We would like to simulate the heavy ion radiation effects in CMOS based microelectronic ICs upto LET values of 80-100 MeV-cm2/mg using LASER based test systems? What kind of LASER sources can be used for such purpose?

If there is any commercial product available in market for SEE testing using LASER sources?

Also, kindly provide any relevant literature reference/weblink etc.

Thanks 

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