How can I measure the thickness of a spin coated thin film?

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Muhammad Shahbaz Anwar

A simple way could be, develop a structure and use AFM in tapping mode to measure the height.

Ghulam Yasin

Dear Koushik Majhi,

You can measure the thickness by AFM, cross section image by SEM or thickness gauge meter.

regards,

Koushik Majhi

Dear Dr. Shahbaz

Thank you very much for your reply. Actually regarding AFM, I do not have any expertise and no knowledge about the technique. So I just want to know, is it possible to take AFM image of a thin film which is spun coated on a quartz substrate?

With Regards

Thank you Dr. Yasin.

Koushik

Thank you Dr. Neil.

Samir G Pandya

Ellipsometry is an elegant method to measure the thickness of thin films of optically transparent materials.

Stylus profilometer: It measures thin film thickness, stress, & surface roughness.

Atomic force microscopy (AFM) or Scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy(SPM).

Scanning electron microscope (SEM): SEM analysis can be performed as part of a film layer analysis to determine the thickness of a film.

UV-Vis spectroscopy: used to measure the thickness and optical properties of thin films on a wafer.

The best method depends on the characteristics of the film material. Also factors like, destructive or non-destructive testing, thin film or thick film, amount of roughness in your film, etc.

I hope the information will help you.

With Best Wishes,

Samir G. Pandya

Sabir Hussain

The easiest way to measure the thickness of the spin-coated continuous thin film is that, first, you stretch the film by lithography technique of AFM, then the thickness can be identified using a tapping mode or contact mode of AFM.