Does anybody have some experiences? And what kind of other methods can you suggest to characterize the structure and chemical composition of PDMS or polymeric surfaces? Thank you very much!
I think you have got good answers by Fateme and Kamran, I just want to mention that when you want to choose the characterization method, you need to consider two main issues:
1. The resolution: For ATR it is around 3 microns, for SIMS it is around 200-300 nm (new SIMS instruments can go down to 50 nm), and for XPS it is around 5-10 nm. So if you really want to see what you have on the surface (for example after surface modification), XPS gives you the best resolution.
2. Although SIMS has higher resolution than ATR, but it is a destructive method which means that (in simple words) it burns the sample surface by bombarding the surface with ions. So if the preparation of your samples is difficult or expensive, you may want to use non-destructive methods such as ATR or XPS.