09 September 2014 2 7K Report

I have sample of LaSrMnO4 which is deposited on STO100 Substrate, and i want to calculate radius of  curvature  of thin film and as well as substrate with the help of rocking curve measurement by XRD technique. For this measurement i am using PANalytical system and model is empyrean with five axis magnetometer.

Incident optics is Hybrid 2 bounce monochromatic crystal and detector is Pixel'3D with anti-scattered slit. 

could you any body help me for this measurement.

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