I have sample of LaSrMnO4 which is deposited on STO100 Substrate, and i want to calculate radius of curvature of thin film and as well as substrate with the help of rocking curve measurement by XRD technique. For this measurement i am using PANalytical system and model is empyrean with five axis magnetometer.
Incident optics is Hybrid 2 bounce monochromatic crystal and detector is Pixel'3D with anti-scattered slit.
could you any body help me for this measurement.