I am attaching the XRD pattern of two of my carbon materials C1 and C2. The C2 carbon shows XRD pattern with a broad peak around 15-25 degree whereas C1 shows two distinct peaks in the same range.
Can anyone help me know the reason for that? and also the reflection planes corresponding to this peaks?
Dear Apurva,
Thomas is right.
Your samples look quite amorphous. In such a case the presence of a ( broad) peak cannot be attributed to a 'reflection' plane. This 'picture' does not work here. It only works for the crystalline contributions to the sample.
You may share a bit more about the type of your samples ( e.g. nano particles, giving rise to strong peak broadening at very low crystallite sizes.)
In case of sample C1 you may have got a thin coverage of very small NPs on top of an amorphous substrate (substrate peaking at ~14°).
Thanks in advance.
.... For peaks of carbon compounds showing up at ~14°, ~25° and ~43° please have a look at Fig. 1 of:
http://www.orientjchem.org/vol34no1/new-route-to-synthesize-of-graphene-nano-sheets/
But I must repeate: if your 'peaks' (case C1) arise from reflections at lattice planes your crystallite size(s) have to be very, very small ( very few lattice constants in diameter).
I agree with Thomas Breuer and Gerhard Martens.
Such patterns are commonly observed for the amorphous carbon materials which tend to form graphite structure. The "broad peak" at about 14o appears in the pattern of some types of carbon black (denka black) and activated carbon.
Thank You for the help. Gerhard Martens Sir, C1 is activated carbon with high surface area whereas C2 has comparatively very low surface area.
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