Hi all,
I suspect that I have some nanometre-sized crystallite scarcely embedded in the surface of an amorphous metallic alloy.
Please see attached EBSD diffraction pattern for reference. It seems there are some diffraction bands looming in a featureless noisy background. One possibility is the crystallites extremely small (so the randomly backscattered electrons from the amorphous phase in the surrounding smear the diffraction bands), other possibility may as well be indeed there is nothing at all in this graph.
Any suggestions on how to improve the graph quality, or suggestions on other techniques can be thought of for this analysis purpose?
Thanks for your insights in advance!
Hi Xxx Sedao,
you could try grazing-incidence x-ray diffraction.
Regards
Philipp
Yes, the surface should be larger than the beam footprint. Also, the spatial distribution of the crystallites is crucial for the signal.
Regards
Philipp
Merci François !
I have another related question I think I could absolutely benefit from your expertise: what would you say the impact/contamination:sample degradation of EBSD analysis on the samples (especially small and thin) being analysed?
The question is from the fact that I often observe, on FIB prepared samples for example: first time EBSD mapping yielding results of satisfactory quality, and then if I wanted to look at localised areas on the very same sample, in more details, smaller steps etc, I wouldn't get same results at all: some EBSD indexed areas would not be indexed again in the second mapping scan. At very same location, EBSDP patterns generated and registered from the first mapping scan would not appear again in the second round mapping scan process. Would this have something to do with some sort of EBSD-induced contamination?
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