I want to make a reactive ion etching of silicon carbide. I would like to get holes with a size of around 200nm in diameter.
So far I have made a first try with a recipe from 'Etching in Microsystem Technology' - Michael Köhler with SF6/O2 but I have got side etching comparable with vertical etching. (See attached picture.)
The question now is how to make systematics tests to find a suitable recipe?
What parameters are most crucial for etching with vertical walls? (Gases flows, ICP power, RF power, pressure)
What is better - having high or low BIAS (and what is 'high' and 'low')?
Is there a difference in which mask I use? Now it is Cr layer, but in literature I saw mainly SiO2 masks. Is it possible that because of the mask I will not get vertical walls or selectivity is the only parameter for how the masks are usually chosen?