The reflectance spectra of a single layer thin-film (spin coated onto Si wafer) shifts as the angle of incidence increases.
Would we expect multilayered films (films consisting of alternating layers of two different materials with different refractive indices) to also exhibit angle-dependence? Would this angle-dependence be even more pronounced, leading to even greater spectral shifts, or less so, with minimal change to reflectance spectra as angle of incidence changes?
To summarize, you ask the question: how will the size effect change depending on changes in the chemical structure of single-layer and multi-layer films. The answer is the size effect is hard to predict. It may be unexpected.
Depending on the film thickness and index, you may end up having a convoluted result. You will be measuring the absorption of the thin film material, but also can get an interference affect. This is how optical filters are made.
For the interference affect, the spectrum will blue shift as your angle moves away from 90' normal.
I agree with Mark Schnittker that it depends on the film thickness and index (both real and imaginary parts). First of all, the reflectance spectra of multilayered thin films do will show angle-dependence. For some absorbing thin films, the angle-dependence will become more significant, you can refer to the paperArticle Scalable all-ceramic nanofilms as highly efficient and therm...
In this paper, we investigated the angle dependence of four-layer thin films.
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