If peak broadening can happen due to solid solution and strain, then why we measure crystallite size using williamson hall method which uses the same peak broadening concept. How this method is useful in measuring the crystallite size in case of microsturctures like martensitic alpha laths inside prior beeta grain boundaries (e.g. Ti6Al4V alloys)?
Hi Amit Kumar Singh Chauhan,
You're correct that peak broadening in X-ray diffraction (XRD) can result from various factors, including solid solution effects, lattice strain, and crystallite size. While peak broadening can arise from multiple sources, the Williamson-Hall method still provides a way to approximate the average crystallite size. This is because it doesn't require specialized equipment or extensive sample preparation, making it suitable for evaluating microstructural features in various materials or can be used for comparative studies, where changes in crystallite size due to different processing conditions or heat treatments can outweigh other factors.
More advanced methods could potentially separate the different contributing factor more accurately, such as transmission electron microscopy (TEM) or electron backscatter diffraction (EBSD).
Hope this helps,
Kind regards
You are right that peak broadening can be due to multiple factors. Also we know our materials processing history. Anyway williamson hall plot gives us crystallite size and strain at the same time from the same data.
https://www.youtube.com/watch?v=KMxjik3u2oU&list=PLIgD0V_AQrxpgq_NLL7zSI8PFGT3N0BNM&index=10
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