I had deposited zinc sulfide thin films by electrochemical deposition, and here the resulting AFM image ...
Best regards.
why did you do AFM? which is the size of your image? 2x2 um? the 2D image is more usefull than the 3D one, i can help you to process your images
Hello from México
Dr. Khaoula,
There are several parameters analyze from AFM, depends on where your research works and aimed. Your 3D image shows that you require morphological characterization. Amplitude or Height parameter, Functional or statistical parameter, Spatial parameters, Line profile, Image (2D and 3D) profile and Histogram analysis are the few parameters which are applicable for surface morphology. If you required any help from my side I am the happiest person to produce results from my best knowledge.
With regards.
Hi,
It seems that you have artifact AFM image due to the damaged tip. This is evidenced by repeating identical shapes in image.
Dr. Nadim,
It was too early to predict such statement. It was obvious that ZnS crystallite produces periodically arrange morphology (as per early reports). I am sorry to say that other than demoralize the research scholar we will guide them properly. For my point of view Research Gate is the platform where every one keen to know some thing from your-side and your knowledge will boost his/her research work.
Thanking you.
It is necessary to have a scale for interpretation of the image. The morphology seems like conventional crystal structures. Actually, an AFM image is a convolution of the tip and scanned surface. The geometry of a tip can provide additional information. In some cases we use TEM visualization for AFM probe's tips before and after a scanning.
Good luck!
First of all, usual 2D visualization with lateral scalebar and vertical scale is much more convenient. Than the next question is what you want from the data characterization. Morphology of the sample represents visible crystallites, you can evaluate its average size, size distribution and so on. From relative position of crystallites you can deduce model of film growth that can be useful to adjust technology parameters.
Before quantitatively analyze the AFM image, make sure it is correct, is not artifact. It is necessary to check the integrity of the tip after scanning. This is especially important for the AFM images that represent a convolution of the tip and the sample shape. This image shows a typical polycrystalline structure. I assume a variety of shapes of the crystallites, even such as in the image. But I doubt that all crystallites may have the same shape in the smallest details. This is typical artifact images when damaged tip defines the same shape for all crystallites in the image.
Without scalebar, mode, tip characteristic, LFM or PI signals, it is difficult to say anything about it.
- Badges
- Science topic
- Similar topics
- Chemistry
- Nanotechnology
- Nanostructures
- Thin Films