For instance, I get a spectrum and the software incorrectly assigns a Si peak as W. If I don't catch it on the software and only have the report (which lists both wt% and at%), is there a way to use the false W percentage to calculate how much it would be for Si instead? And then adjust the rest of the detected elements accordingly? Or is my only option to go back and correct it using the software and generate a new report?
Run your file with acquired spectrum through EDS software again, assign peaks manually. Easy and clean solution. Do not use incorrectly obtained data in your research. And it looks like your system is due to calibration.
Run your file with acquired spectrum through EDS software again, assign peaks manually. Easy and clean solution. Do not use incorrectly obtained data in your research. And it looks like your system is due to calibration.
The K line of Si and M line of W are very close (1.74 keV vs. 1.78 keV), and you cannot resolve it. The easy way is to use L lines of W (several lines from 8 keV to 12 keV) for W quantification and re-calculate Si. But you should take into consideration secondary absorption.
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