Deep-level transient spectroscopy (DLTS) is an experimental tool for studying electrically active defects or best known as charge carrier traps in semiconductors, for investigating the effects of radiation on semiconductors we need more information about defects profile after radiation and DLTS is great tool offers a lot data on this aspect, is there any way of simulating DLTS ?

More Oussama Zaoui's questions See All
Similar questions and discussions