4 Questions 3 Answers 0 Followers
Questions related from Oussama Zaoui
hello dears, I was wondering if we always can refer the degradation in carrier lifetime due to ion irradiation damage to SRH recombination and should this equation always be...
30 March 2021 6,077 0 View
Deep-level transient spectroscopy (DLTS) is an experimental tool for studying electrically active defects or best known as charge carrier traps in semiconductors, for investigating the effects of...
31 October 2019 2,976 0 View
Hello everyone, i want to transfer SRIM output to defects profile in SCAPS or wxAMPS but i couldn't define the values of defects density and their types, energy levels, cross section n/p... Any...
16 September 2018 6,953 2 View
Hello everyone, Is the radiation causing different types of defects in semiconductors ? And if yes, what are the types of defects created by radiation in semiconductor materials ?
01 January 1970 8,952 5 View