We have deposited 2 microns metallic thin films on graphite using physical vapor deposition. Then we irradiated those samples at different irradiation doses (by varying ion energy and fluence). Micropores are reported in various similar studies. We also want to analyze those micropores using cross-sectional images in a scanning electron microscope. Will this method work? or I can make any modification using an etching agent to enhance my result? Any suggestion or literature recommendation will be appreciated.
Best Regards
I am not an expert.. I think you can get signatures of micropores on the surface too along with the cross section.. you can also go for TEM. In case of etching you should make sure that you consider the effect of etchants.. results may get affected by etching.
It will be difficult to locate such thing on cross section.....as such exposer scope and intensity will create more events.....probability of getting such pore in cross section will be low..and scope of view will also reduces the probability...so rigorous analysis will be required with knowledge of signatures of event.
SEM allows you to see micro and macropores. Cross section is a good option. But graphene may not be visible on the SEM. In any case, you need to try
It depends upon SEM resolution. If it's a high-resolution SEM, then it can be seen in a broad area region collectively. It will be easier to observe through TEM/HRTEM characterization but in a very small region.
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