In FullProf suite, even without the CIF, you can refine diffraction data. You just have to find the information regarding space group, lattice parameters (a,b,c,alpha,beta,gamma), atomic positions of principle wyckoff sites and associated Biso and occupancy values.

Basically, a CIF is a collection of the above information in a specified format for a unit cell. One can directly import all these, if CIF is available. Otherwise, you can manually enter all these information in FullProf EdPCR menu. Of course, for this information, you have to find some suitable literature.

Dear Suraj

Without CIF you cannot perform Rietveld refinement. You can choose any Wyckoff position of any close structure to your sample.

Regards

Thank you Mr. Souvik Bhattacharjee and Mr. Afroz Khan for your reply.

I am getting some information as space group, lattice parameters from JCPDS data card. Other parameters such as Final coordinates and anisotropic thermal parameters are found from reference of JCPDS. But how can I get wyckoff sites and associated Biso and occupancy values ?

Dear Suraj Anandrao Khalate

You can try with the Wyckoff position of any close structure or you have to solve structure by random method like Peterson method.

regards

Dear Afroz Khan

Thank you for your suggestion. I will do as directed and let you know soon.

Welcome...Hope problem will be solved...

When you say "doing Rietveld refinement", what do you actually want to know? Is it quantitative phase analysis, crystallite size/microstrain, confirmation of phase ID...

The next step depends on what you want to do.

Dear Matthew R. Rowles

Actually, he asked the question generally regarding the Rietveld refinement that how can he perform the refinement without previously reported CIF.

All the parameters will be calculated after refinement.

kind regards

Dear Matthew R. Rowles

Thank you for your reply. I am doing refinement for the structural model and confirmation. So, please give suggestions for it.