We have reflectance data of multilayer oxide films in which metal film is sandwiched. We want to extract refractive index values of the oxide layers. Is this possible?
Using any fitting program we can fit the reflectance data and obtain the real scattering length density(rho) and imaginary density(b).
Now with that we can calculate the refractive index of the mutilayers from the following formula:
R.I (refractive index)= 1- [(lamda)^2 ]*rho/2*pi +ib
Also for the oxide layer we might need to model the simulation of multilayer stack by introducing an oxide top layer.
With proper simulation it should be possible.
Hope this helps.
Thanks Saumya Mukherjee, Can you tell me about any such fitting software? Since I have some fitting software, but could not get required results.
Essentially used software:
Simullreflec or Parratt or EDXR (SIMULATION)
Thanks Saumya for the software information but these softwares are related to X-rays or Neutron spectroscopy, but not optical spectroscopy. I have reflectance data taken from photospectrometer. I hav'nt find a way to use these softwares.
You can use IgorPro for simulation of the model or EDXR with wavelength in the order optical regime.
I hope this helps.
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