We developed a multiinjection method for GC/MS in the SIM mode with 96 injection within 3h. Can ion suppression be a problem for GC/MS in such a system and why?
in IC you have a special module that exchange the ions (suppress them) for conductive detection. But in MS you obtain the suppresion by SIM mode or MRM in MSxMS.
In the pure sense ion suppression is not a problem for GC/MS, but You might have related effects. Coeluting peaks may lead to quasi chemical ionization in normal EI ionization and therefore may reduce signal intensity of fragments. Don't forget that for ion trap MS there is also an effect of the AGC (Automatic Gain Control).
Actually I wanted to avoid ion suppression. The problem is: I have a complex reaction mixture and I am measuring in the SIM mode and I am afraid that I have wrong results caused by reduction of the signals because I am using this multiinjection peaks.