Depends on what you are reporting. If you want to report scratch volume then it may not be easy to calculate without AFM/SPM images and 3D profiles. Of course you can report COF and post-scratch SEM analysis without AFM images.
What do you want to study? Layer thickness or scratch friction (critical load)?
Maybe have a look at
Zhao et al. Appl Surf Sci, 2008, 255 2295-2302
Kuttner et al. ACS Appl Mater Inter 2012, 4, 3484-3492
Absolutely, the Scratch Test is typically studied through Microscope Imaging. Visit here to see many app notes on the subject:
http://www.nanovea.com/ApplicationNotes.html
The critical question is what kind of scratches you have on your samples. For micro scratches optical microscopy can be used. If you have smaller defects below the optical resolution limit you can apply SEM to get an overview of your sample and AFM to get quantitive measurements of the surface. Have a look at the Zhao et al. paper. Also there are surface testing devices like the UST (universal surface tester by INNOWEP, Germany) which can be used for scratch tests. Furthermore white light interferometry can be used to image the surface morphology. I believe the AFM approach (nanoindentation + scratch imaging) is the most quantitative approach - but this first and foremost depends on what kind of scratches (size, depth) you are inducing.
You can not present the scratch data without images. Since all the calculations depend on the image data. For example critical width, critical load, cohesive cracks, and adhesive cracks. For more information you can refer my papers.
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