While I wouldn't rely heavily on SEM images, your film could be just too thin to detect any degree of crystallinity (which probably polycyrstal grains within your films) using laboratory XRD.

In such case, you can either attempt using a synchrotron XRD or TEM (SAED if needed) if you want to attempt to extract crystallinity information.

Thanks Jea for your clarification. I did my XRD in grazing incidence mode with alpha=0.5 degree. I was looking at the possible outcomes with the variation of substrate temperature on crystallinity. What I see that at RT deposition YSZ film shows amorphous nature (GIXRD) and with increase in temperature the crstallinity (GIXRD) comes to picture. But the FESEM image shows columnar grains. There I confused.

So I did TEM investigation. The SAED pattern shows amorphous + crystalline (polycrystalline). I did some literature search and found that the amorphous YSZ becomes crystalline during TEM due to electron beam induced crystallization.

What should I do here now ? plz suggest.