First, you need to separate the XRD peak’s broadening caused by small zones of cohernt scattering from that caused by non-uniform stresses. At the next stage you can apply the Scherrer formula to calculate the first one. Assuming that the zones of coherent scattering are restricted by grain boundaries, the calculated value is an grain size in the examined volume. But be careful: the low-angle boundaries may also contribute to a peak broadening, so I recommend to recheck your measurement by additional technique, for example TEM.
By applying Scherrer equation on the XRD pattern, the particle size can be calculated:
(D=Kλ/(β cos θ)
Where D is the mean size of crystallites (nm), K is crystallite shape factor a good approximation is 0.9, λ is the X-ray wavelength, B is the full width at half the maximum (FWHM) in radians of the X-ray diffraction peak and θ is the Braggs' angle (deg.)
Scherrer’s equation:
Particle Size = (0.9 x λ)/ (d cosθ)
λ = 1.54060 Å (in the case of CuKa1) so, 0.9 x λ = 1.38654
Θ = 2θ/2 (in the example = 20/2)
d = the full width at half maximum intensity of the peak (in Rad) – you can calculate it using Origin software.