Dear Sir,

the way you ask makes believe that you are by no means familiar with this technique. So please do not try to do any analysis by your own.

That will not work !!! Literature gives a long list of examples when people

tried to do so, finally meeting their Waterloo.

Analyzing XPS data is not straigthforward, even in the most simple case that

you "just" want to determine the stoichiometry of your sample (i.e., the ESCA idea

behind this technique).

Here, oxygen is a nice keyword: Is the O-1s intensity related

rather to surface contaminations (as, e.g., from adsorbates) or

is it related to the sample itself?

Please ask the people who provided these data for assistance in data analysis.

Sincerely, FM

Dear Sir,

the way you ask makes believe that you are by no means familiar with this technique. So please do not try to do any analysis by your own.

That will not work !!! Literature gives a long list of examples when people

tried to do so, finally meeting their Waterloo.

Analyzing XPS data is not straigthforward, even in the most simple case that

you "just" want to determine the stoichiometry of your sample (i.e., the ESCA idea

behind this technique).

Here, oxygen is a nice keyword: Is the O-1s intensity related

rather to surface contaminations (as, e.g., from adsorbates) or

is it related to the sample itself?

Please ask the people who provided these data for assistance in data analysis.

Sincerely, FM

You can use XPSPEAK41 shoftware and details you can find out at the net.

CasaXPS software is the best software that can be used to analyse XPS spectra. If you need help contact me at [email protected]

Thank you all for the answers, yes I am new with XPS and want to know how can we analyze the data. basically I want to quantify the ratios of elements in my compound and also want to know the behavior of oxygen.

Dear Sir,

From XPS spectra you can obtain the elemental composition, including weight ratio and atomic ratio, of the surface of your sample, which is also the composition of the sample assuming the surface is the same as the bulk. In other way via peak splitting using XPS software you can also get the information about the chemical environment of a specific element, for instance for nitrogen, XPS can tell you whether N is in graphitic or pyrrolic or pyrodinic form or combined two or three. Of course the ratio of the different forms can be obtained as well.

Hope this is helpful.

XPS peak identification or data analyses can easily be done by NIST X-ray Photoelectron Spectroscopy (XPS) Database gives easy access to the energies of many photoelectron and Auger-electron spectral lines. Resulting from a critical evaluation of the published literature, the database contains over 22,000 line positions, chemical shifts, doublet splittings, and energy separations of photoelectron and Auger-electron lines. A highly interactive program allows the user to search by element, line type, line energy, and many other variables. Users can easily identify unknown measured lines by matching to previous measurements. web access link is - http://srdata.nist.gov/xps/intro.aspx

Dear  Shivesh sir.. Kindly give me the link for downloading XPSPEAKfit software.. I didnt get.. 

If you have XPS data, you can use CasaXPS software to analyze it. I found a link relating your question. Maybe it will resolve your problem.

https://www.youtube.com/watch?v=2GU8WO-GIZc

Dear Colleague Afraz,

X-Ray photoelectron spectroscopy, XPS was used to investigate the chemistry at the surface of the samples. The basic mechanism behind an XPS instrument is that  the photons of a specific energy are used to excite the electronic states of atoms at and just below the surface of the sample.

There are several areas suited to measurement by XPS:

1. Elemental composition

2. Empirical formula determination

3. Chemical state

4. Electronic state

5. Binding energy

6. Layer thickness in the upper portion of surfaces

XPS has many advantages, such as  it is is good for identifying all but two elements, identifying the chemical state on surfaces, and is good with quantitative analysis. XPS is capable of detecting the difference in chemical state between samples. XPS is also able to differentiate between oxidations states of molecules.

XPS  has also some limitations, for instance, samples for XPS must be compatible with the ultra high vacuum environment.  XPS is limited to measurements of elements having atomic numbers of 3 or greater, making it unable to detect hydrogen or helium. XPS spectra also take a long time to obtain. The use of a monochromator can also reduce the time per experiment. 

Hope this helping

Have a very good day