I have heard that this difference in density values from gas displacement and XRD measurement methods can determine the vacancy concentration (Schottky, not Frenkel pairs) and from which a measure of disorder can be determined for an oxide system. I have not come across any literature utilizing this type of methodology. Is anyone familiar with this concept or has seen it used? Thanks!
Researchers reported dislocation density of the prepared materials can be determined from XRD, by computational methods they reported the vacancy, site, group of structural studies. The question is based on the results of electrical studies, I think XRD did not give the analytical results for this electrical studies, it gives the results of structural studies.
Dear colleague Brianna Musico
Have a nice time and good day.
Peace be up on you and all RG members and your question's readers.
Disorder can be inferred using spectroscopic measurements too. Please fined an attached paper gives more details about the used procedure. I already put a green highlighted marker on the important text to save your time.
I wish this is useful and help you.
Yours
A. EL-Denglawey
- Badges
- Science method
- Similar topics
- Methodology
- Crystallography
- X-ray Diffraction