I'm using Argon plasma etching to increase layer to layer adhesion during Ni electroplating with photoresist as the mask. My hypothesis is the Ar etch will remove organic material, remove NiO on previous layer, create roughness on the Ni & improve contact angel to increase adhesion.
The tricky part is that i have Cu presence in the layer 1.
I use shear testing to test the adhesion & the result has been inconsistent, while the NiO removal has been consistently effective. The result has draw me these questions:
- What's the effect of Cu presence? will it be redeposited on top of the Ni?
- What's the selectivity of Ar etching between Ni & photoresist? also between Ni to Cu?
The result has shown that adhesion is better in 4" wafer compare to 6" wafer, but increasing the time in the 6" wafer has made adhesion worse, it could be because of the Cu presence. Does anyone has a better explanation?