I have been trying to find a resource to identify the circuit element structures (from an optical micrograph) of delidded/decapsulated electronic devices, including the imaged Xilinx Arty A7 FPGA. My goal is to electrically stress one element or region of the circuit and see if that affects the sensitivity to localized ionizing radiation in the form of single event transients or single event upsets. I can see the electrical leads towards the octagonal structures, but I am not sure what they are (Capacitors?). I have circled a few other structures that appear as dots on this micrograph. Is there a resource I could use to help me identify these structures and how to locally electrically stress them? I have done so on simpler devices, like operational amplifiers, but this structure is more complex.
Thank you.
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