I've built a low noise transimpedance amplifier (TIA) to measure low frequency noise in semiconductor devices. The amplifier is connected to a triaxial prove station, supplied with +/- 7.8V using rechargable NiMH batteries and the output is acquired using a PCI acquisition board.

Amplifier calibration using SMD resistors connected between tip and chuck yields the correct noise density at the output, but when a device is connected (a diode or a MOS capacitor) large 50Hz and 100Hz harmonics seem to couple in the input (these componentes are amplified at the output and saturate the amplifier). The amplitude of such components is strongly dependent with DC current flowing through the DUT.

I've tried searching for ground loops, different conditions of ground connections, even changing the instruments that are connected to the supply line, and I see very different results without a clear trend: disconnecting some grounds reduce the coupling while disconnecting others increase it.

Anyway, for larger currents and larger DUT capacitances , the effects worsen in all cases. I've tried overcompensating the TIA, but I'm not obtaining better results.

I've also tried turning off the lights, disconnecting any inductive loads from the lab line...

I'm running out of ideas, and I wondered if anyone trying to acquire low frequency noise have ever had problems like this with the experimental setup.

Thanks in advance.

Similar questions and discussions