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Questions related from Satyendra Kumar Mourya
I have deposited catalytic film of bimetallic Pd-Pt for hydrogen adsorption studies. Is there any technique other than UPS to directly calculate the workfunction of the bimetallic film? Any help...
22 October 2018 7,897 3 View
Hell, I have grown semiconducting film of SiC on four different substrates ( ZrO2, MgO, SiC, and Si) via RF-sputtering at a substrate temperature of 800 °C and found best crystalline film on Si....
16 February 2018 1,881 2 View
I have fabricated thin films of SiC and observed that the physical properties of the films are quite different from its bulk. The particle size of grown films is in the range of 10-13 nm whereas...
14 September 2017 6,061 5 View
I am interested to know the exact relationship between dislocation density, free carrier concentration and impurity present in the semiconductor materials. Does the free carrier concentration have...
19 June 2017 6,972 2 View
In Drude-Lorentz equation which parameters are realistic for the consideration in spectroscopic ellipsometry. Any input is highly appreciable.
29 August 2016 7,088 3 View
I am fabricating two terminal MOS structure using high-k oxides on Si substrate. I am fabricating oxide layer at room temperature and will keep the oxide layer thickness 20, 50, 100 and 200 nm...
26 July 2016 3,071 0 View
I am fabricating MOS capacitors based on high-k gate dielectrics using reactive sputtering. Can you please suggest me the technique(DC or RF sputtering) which will yield the high quality gate oxide.
18 July 2016 3,486 4 View
Hi everyone, I want to measure dielectric properties of my samples in the temperature range of 400-900 °C. Can I use Cu wire for making electrical contacts, if no, please suggest me the contact...
17 February 2016 365 5 View
I have single crystalline film of SiC of Rhombohedral structure. I want to calculate the lattice constant of SiC but I am not able to determine the angle.
20 January 2016 630 4 View
I have executed the c-v measurement of Al/HfO2/Al structure using impedance analyzer and I have found a non linear relationship between c & v. As i see, the case of above said structure...
05 October 2015 7,697 6 View
Please suggest me the proper solution.
04 June 2015 3,971 12 View
I have grown SiC thin films by RF magnetron sputtering. Structural analysis was being done by XRD, which revealed hexagonal phase. Now how to decide whether the grown films is, 2H, 4H or 6H
21 May 2015 1,177 4 View
Hi everyone, I need your valuable input and appreciate it in advance. I have synthesized SiC thin films on four different substrates (Zirconia, MgO, SiC and Si) by RF-magnetron sputtering. I did,...
01 January 1970 7,755 3 View
Why we get no absorbance at higher energies compared to band gap energy of Rhodamine 6G?
01 January 1970 5,811 2 View
